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Failure analysis single item detection

Auger electron spectroscopy analysis(AES)


X ray analysis (X-ray)


Cross section &Microscope (Metallographic)


SEM and EDS analysis (SEM&EDS)


Laser confocal Raman microspectroscopy (Micro Raman spectroscopy)


X ray diffraction analysis(XRD)


Micro Fourier transform infrared spectroscopy (FTIR)


Acoustic scanning analysis(C-SAM)


Transmission electron microscope(TEM)


X-ray fluorescence spectrometric analysis(XRF)


Staining analysis (Staining)



Inductively coupled plasma atomic emission spectrometry (ICP-OES)X-RAY perspective microscopeGas chromatography-mass spectrometry GC-MS
Scanning electron microscope and energy dispersive spectrometer SEM/EDSAcoustic scanning microscope SAMTransmission electron microscope TEM