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Failure analysis single item detection

Auger electron spectroscopy analysis（AES）

 

X ray analysis (X-ray)

 

Cross section &Microscope (Metallographic)

 

SEM and EDS analysis (SEM&EDS)

 

Laser confocal Raman microspectroscopy (Micro Raman spectroscopy)

 

X ray diffraction analysis（XRD）

 

Micro Fourier transform infrared spectroscopy (FTIR)

 

Acoustic scanning analysis（C-SAM）

 

Transmission electron microscope（TEM）

 

X-ray fluorescence spectrometric analysis（XRF）

 

Staining analysis (Staining)

 

 

Inductively coupled plasma atomic emission spectrometry (ICP-OES)X-RAY perspective microscopeGas chromatography-mass spectrometry GC-MS
Scanning electron microscope and energy dispersive spectrometer SEM/EDSAcoustic scanning microscope SAMTransmission electron microscope TEM

 

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SU ICP No.06021871-1